| Requirement | DC resistance values measured at the test voltages specified below : <10@0.1V,<100@0.3V,<1K@1.0V,<10K@3V, <100K@10V, <1M@25V, <10M@30V Within the specified tolerance < 50m | Natural resistance change per change in degree centigrade. (R2-R1)/R1 10^6 / (t2-t1) (ppm/C) t1 : 20C+5C-1C R1 : Resistance at reference temperature R2 : Resistance at test temperature Refer to QUICK REFERENCE DATA | Permanent resistance change after a 5second application of a voltage 2.5 times RCWV or the maximum overload voltage specified in the above list, whichever is less. R/R max. (2%+0.10) < 50m | Un-mounted chips completely immersed for 101second in a SAC solder bath at 2605C R/R max. (1%+0.05) no visible damage < 50m | Un-mounted chips completely immersed for 20.5 second in a SAC solder bath at 2355 good tinning (>95% covered) no visible damage | 30 minutes at -55C3C, 2~3 minutes at 20C+5C-1C, 30 minutes at +155C3C, 2~3 minutes at 20C+5C-1C, total 5 continuous cycles R/R max. (1%+0.05) no visible damage < 50m | 1000 +48/-0 hours, loaded with RCWV or Vmax in chamber controller 702C, 1.5 hours on and 0.5 hours off R/R max.(3%+0.10) For 10R<1M ; R/R max.(5%+0.10) For R<10, R1M < 50m | 1000 +48/-0 hours, loaded with RCWV or Vmax in humidity chamber controller at 40C2C and 90~95% relative humidity, 1.5hours on and 0.5 hours off R/R max.(3%+0.10) For 10R<1M ; R/R max.(5%+0.10) For R<10, R1M < 50m | Pressurizing force: 5N, Test time: 101sec. No remarkable damage or removal of the terminations. | Apply the maximum overload voltage (DC) for 1minute R10G | Apply the maximum overload voltage (AC) for 1 minute No breakdown or flashover |
