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Operating Temperature : -55℃~+125℃
Nominal Capacitance : 100nF
Voltage Rating : 50V
Tolerance : ±20%
DC Resistance(DCR) : 3mΩ
Current Rating : 6A
Description : 100nF ±20% 3mΩ SMD-3P,1.6x3.2mm Feed Through Capacitors RoHS
Mfr. Part # : NFM31HK104R1H3L
Model Number : NFM31HK104R1H3L
Package : SMD-3P,1.6x3.2mm
The MURATA NFM31HK104R1H3 is a Very Large Current 3 Terminals Low ESL Chip Multilayer Ceramic Capacitor designed for EMI filtering in automotive electronic equipment. It offers low ESL and high current handling capabilities, making it suitable for demanding applications.
| Part Number | Capacitance | Capacitance Tolerance | Rated Voltage | Rated Current | DC Resistance (max.) | Operating Temperature Range | Storage Temperature Range | Package Size Code | Packaging | Standard Packing Quantity |
| NFM31HK104R1H3 | 0.1F | +/-20% | DC 50V | DC 6A | 3m | -55 to 125 | -55 to 125 | 3216M(1206) | 180mm Reel Plastic Tape (W8P4) | 3000 pcs./Reel |
| Test Item | Specification | Test Method (Ref. Standard: AEC-Q200) |
| Resistance to Soldering Heat | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m below | Solder bath method: Sn-3.0Ag-0.5Cu (Lead Free Solder), 270+/-5, 10+/-1s |
| Vibration | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 50m below | Simple harmonic motion 10Hz to 2000Hz to 10Hz, Total amplitude 1.5 mm or Acceleration amplitude 196m/s2 whichever is smaller, 20min per direction, 3 directions |
| Mechanical Shock | Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. DC Resistance: 50m below | Half-sine waveform, Peak value 1500g, Holding Time 0.5ms, Velocity change 4.7m/s, 3 shocks per direction, 3 directions |
| Operational Life | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50M | Mounting method: Solder on test substrate. Test Temperature: Maximum Operating Temperature +/-3. Test Time: 1000+/-12h. Test Voltage: 100% of the rated voltage. |
| Biased Humidity | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50M | Mounting method: Solder on test substrate. Test Temperature: 85+/-3. Test Humidity: 80%RH to 85%RH. Test Time: 1000+/-12h. Test Voltage: Rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister). |
| Temperature Cycling | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m below I.R. (Room Temp.): Within the specified initial value. | Mounting method: Solder on test substrate. Cycles: 1000 cycles. |
| High Temperature Exposure (Storage) | Appearance: No defects or abnormalities. Capacitance Change: Within +/-12.5% DC Resistance: 50m below I.R. (Room Temp.): More than 50M | Mounting method: Solder on test substrate. Test Temperature: Maximum Operating Temperature +/-3. Test Time: 1000+/-12h. |
| Terminal Strength | Appearance: No defects or abnormalities. | Applied Force: 9.8N, Holding Time: 30s |
| Board Flex | Appearance: No defects or abnormalities. Capacitance Change: Within +/-7.5% DC Resistance: 50m below | Mounting method: Reflow solder on test substrate. Flexure: 1mm, Holding Time: 30s |
| Voltage proof | Appearance: No defects or abnormalities. DC Resistance: Shown in Rated value. | Test Voltage: 300% of the rated voltage, Applied Time: 1s to 5s |
| Insulation Resistance(I.R.) (Room Temperature) | More than 1000M | Measurement Voltage: Rated Voltage, Charging Time: 2min |
| Solderability | 95% of the terminations is to be soldered evenly and continuously. | Pre-treatment: Heat treatment at 155C for 4 hours. Flux: Rosin ethanol 25(mass)%. Solder: Sn-3.0Ag-0.5Cu (Lead Free Solder) at 245+/-5 . |
| Beam Load Test | Destruction value: More than 14.7N | Speed supplied the Stress Load: 0.5mm/s |
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Automotive EMI Filter Very Large Current Low ESL Multilayer Ceramic Capacitor muRata NFM31HK104R1H3L 3 Terminals Images |